CAMERA

for specimen chamber of Scanning Electron Microscope


                             

                            imaged by an infrared camera

Applications.

Observation, surveillance of specimen chamber of all scanning electron microscope.

Characteristics.

Miniature IR Camera with built-in IR light source for total darkness.
Available for all specimen chamber of SEM , TEM, ...
Wide field of view. Avoid conflicting of objects within the specimen area
To be used with SE and other detectors that are not sensitive to IR light
Image CCD 1/3".
Picture elements:
542(H)x492(V)
Auto-electronic iris control.
Built-in ultra wide angle lens:
85° horizontal, 62° vertical.
Composite video CCIR, or EIA 1V p-p positive. Impedance 75ohms.
Compact size: 60(Ø)x80(l).
Remote control

220V or 100V/12 VDC/200mA operation.
X-Ray radiation ( 4µSv/h )

Option.

Monitor B/W.

Environmental.

Operating temperature: -10°C to 50°C.
Humidify: 0 à 95% RH.

Option.

Monitor: B/W

Environnement.

-10°C à 50°C.
Humidity: 0 à 95% RH.


Others products
Electron gun: field emission, photo emission, thermoionic emission
Optique électronic
Electronics
Maintenance.